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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II - Design and development of multi functional confocal laser scanning microscope with UV / VIS laser source
Kanai, Yoshikazu, Duparr½Á, Angela, Singh, Bhanwar, Kanzaki, Yousuke, Wakaki, Moriaki, Gu, Zu-Han, Takeyama, NorihideVolume:
5878
Year:
2005
Language:
english
DOI:
10.1117/12.616637
File:
PDF, 527 KB
english, 2005