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SPIE Proceedings [SPIE Optics East 2005 - Boston, MA (Sunday 23 October 2005)] Two- and Three-Dimensional Methods for Inspection and Metrology III - Fast software implementations of common 3x3 operators
Waltz, Frederick M., Harding, Kevin G., Miller, John W. V.Volume:
6000
Year:
2005
Language:
english
DOI:
10.1117/12.634979
File:
PDF, 552 KB
english, 2005