SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Optical Design and Testing III - Measurement of self-organization pattern in dielectric barrier discharge by a special photoelectronic detection system
Zhao, Zengchao, Wang, Yongtian, Tschudi, Theo T., Dong, Lifang, Qi, Yuyan, Rolland, Jannick P., Tatsuno, Kimio, He, Yafeng, Li, YonghuiVolume:
6834
Year:
2007
Language:
english
DOI:
10.1117/12.755539
File:
PDF, 382 KB
english, 2007