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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 7 April 2008)] Semiconductor Lasers and Laser Dynamics III - Measurement and simulation of the lateral mode profile of broad ridge 405 nm (Al,In)GaN laser diodes
Braun, Harald, Panajotov, Krassimir P., Sciamanna, Marc, Scholz, Dominik, Meyer, Tobias, Valle, Angel A., Michalzik, Rainer, Schwarz, Ulrich T., Queren, Désirée, Schillgalies, Marc, Brüninghoff, StefaVolume:
6997
Year:
2008
Language:
english
DOI:
10.1117/12.781314
File:
PDF, 965 KB
english, 2008