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SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Novel photon correlator with less hardware resource
Liu, Wei, Zhang, Yudong, Wyant, James C., Shen, Jin, Cheng, Yanting, Smythe, Robert A., Wang, Hexin, Chen, WengangVolume:
7283
Year:
2008
Language:
english
DOI:
10.1117/12.828769
File:
PDF, 208 KB
english, 2008