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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications - View field blemishes of ICCD
Liu, Shulin, Zhang, Kun, Wang, Xiang-jun, Deng, Guangxu, Li, Yanhong, Zhang, Guang-jun, Ai, Ke-cong, Pan, Jingsheng, Wang, Zhihong, Zeng, Guilin, Sun, JianninVolume:
7384
Year:
2009
Language:
english
DOI:
10.1117/12.835906
File:
PDF, 428 KB
english, 2009