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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Optic-electronic systems for measuring the angle deformations and line shifts of the reflecting elements at the rotateable radio-telescope
Konyakhin, Igor A., Lehmann, Peter H., Osten, Wolfgang, Timofeev, Alexandr N., Usik, Alexandr A., Gastinger, Kay, Zhukov, Dmitry V.Volume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.890059
File:
PDF, 395 KB
english, 2011