SPIE Proceedings [SPIE 1983 Brookhaven Conference - Upton (Monday 17 October 1983)] Science with Soft X-Rays - On The Possibility Of Measuring The Diffraction Pattern Of Single Micro Objects
Sayre, D, Haelbich, R, P., Kirz, J, Yun, W B., Klaffky, Roger W., Himpsel, F. J.Volume:
447
Year:
1984
Language:
english
DOI:
10.1117/12.939198
File:
PDF, 53 KB
english, 1984