Influence of Annealing on the Stress-Assisted Two-Way Memory Effect in Cold-Worked NiTi Wire
Yan, Xiaojun, Ge, Yuli, Van Humbeeck, JanVolume:
17
Language:
english
Journal:
Advanced Engineering Materials
DOI:
10.1002/adem.201400156
Date:
February, 2015
File:
PDF, 1.42 MB
english, 2015