Logic Control of Interface-Induced Charge-Trapping Effect...

Advanced Materials Technologies 2016 / 06 Vol. 1; Iss. 3

Logic Control of Interface-Induced Charge-Trapping Effect for Ultrasensitive Gas Detection with All-Mirror-Image Symmetry

Jia, Chuancheng, Wang, Qing, Xin, Na, Zhou, Jian, Gong, Yao, Li, Lidong, Sun, Qiang, Guo, Xuefeng
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Volume:
1
Language:
english
Journal:
Advanced Materials Technologies
DOI:
10.1002/admt.201600067
Date:
June, 2016
File:
PDF, 1.94 MB
english, 2016
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