Mobilities of quenched-in defects in NiAl

Philosophical Magazine A 1983 / 03 Vol. 48; Iss. 3

Mobilities of quenched-in defects in NiAl

Wang, Tian-Min, Shimotomai, Michio, Doyama, Masao
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Volume:
48
Language:
english
Journal:
Philosophical Magazine A
DOI:
10.1080/01418618308234905
Date:
March, 1983
File:
PDF, 337 KB
english, 1983
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