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A method for measuring the specular X-ray reflectivity with millisecond time resolution
Voegeli, Wolfgang, Matsushita, Tadashi, Arakawa, Etsuo, Shirasawa, Tetsuroh, Takahashi, Toshio, Yano, Yohko FVolume:
425
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/425/9/092003
Date:
March, 2013
File:
PDF, 739 KB
english, 2013