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EFFECT OF DEEP TILLAGE AND MICROTOPOGRAPHY ON CORN YIELD ON RECLAIMED SURFACE-MINED LANDS1,2
VAN ES, HAROLD M., THOMPSON, MICHAEL L., HENNING, STANLEY J., HORTON, ROBERTVolume:
145
Journal:
Soil Science
DOI:
10.1097/00010694-198803000-00003
Date:
March, 1988
File:
PDF, 483 KB
1988