Subjective Annoyance From Exposure to Low Frequency Noise...

Epidemiology 2011 / 01 Vol. 22

Subjective Annoyance From Exposure to Low Frequency Noise of Semiconductor Manufacturing in the Packaging and Testing Processes

Chao, Pao-Chiang, Chen, Chiou-Jong, Tsao, Ta-Ho, Dai, Yu-Tung, Juang, Yow-Jer
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Volume:
22
Language:
english
Journal:
Epidemiology
DOI:
10.1097/01.ede.0000392486.59925.03
Date:
January, 2011
File:
PDF, 2.20 MB
english, 2011
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