![](/img/cover-not-exists.png)
Effects of test-mask similarity on forward and backward masking of patterns by patterns
Tadasu Oyama, Takeo Watanabe, Masami FunakawaVolume:
45
Language:
english
Pages:
11
DOI:
10.1007/bf00308709
Date:
November, 1983
File:
PDF, 567 KB
english, 1983