Effects of test-mask similarity on forward and backward...

Effects of test-mask similarity on forward and backward masking of patterns by patterns

Tadasu Oyama, Takeo Watanabe, Masami Funakawa
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Volume:
45
Language:
english
Pages:
11
DOI:
10.1007/bf00308709
Date:
November, 1983
File:
PDF, 567 KB
english, 1983
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