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SPIE Proceedings [SPIE Optical Tools for Manufacturing and Advanced Automation - Boston, MA (Tuesday 7 September 1993)] Industrial Optical Sensing and Metrology: Applications and Integration - Improvement of local strain measurement by grid method: new optical device and quasi-heterodyne technique
Dupre, Jean-Christophe, Cottron, Mario, Lagarde, Alexis, Harding, Kevin G., Stahl, H. PhilipVolume:
2066
Year:
1993
Language:
english
DOI:
10.1117/12.162093
File:
PDF, 507 KB
english, 1993