SPIE Proceedings [SPIE Optics for Productivity in...

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SPIE Proceedings [SPIE Optics for Productivity in Manufacturing - Frankfurt, Federal Republic of Germany (Sunday 19 June 1994)] Automated 3D and 2D Vision - High-speed high-resolution color line scan camera for machine vision

Litwiller, David J., Miethig, Mike, Doody, Brian C., Jenkins, P. Tom, Ahlers, Rolf-Juergen, Braggins, Donald W., Kamerman, Gary W.
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Volume:
2249
Year:
1994
Language:
english
DOI:
10.1117/12.196072
File:
PDF, 514 KB
english, 1994
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