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SPIE Proceedings [SPIE Optoelectronic and Electronic Sensors IV - Gliwice, Poland (Tuesday 13 June 2000)] Optoelectronic and Electronic Sensors IV - Microscopic study of the structure of the SnO2 thin films obtained by the RGTO technique
Uljanow, Jerzy, Waczynski, Krzysztof, Broja, Adam, Karczewska-Buczek, Teresa, Fraczek, JerzyVolume:
4516
Year:
2001
Language:
english
DOI:
10.1117/12.435943
File:
PDF, 321 KB
english, 2001