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SPIE Proceedings [SPIE International Symposium on Optoelectonics and Microelectronics - Nanjing, China (Wednesday 7 November 2001)] Semiconductor Optoelectronic Device Manufacturing and Applications - Measurement of optoelectronic lifetime in imaging process of silver halide material
Fu, Guangsheng, Yang, Shaopeng, Li, Xiao-Wei, Hu, Xiaoyong, Chen, David, Chen, Ray T., Wang, Guo-Yu, Zhu, Chang-ChangVolume:
4602
Year:
2001
Language:
english
DOI:
10.1117/12.445752
File:
PDF, 50 KB
english, 2001