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SPIE Proceedings [SPIE Photonics Fabrication Europe - Brugge, Belgium (Monday 28 October 2002)] Laser Diodes, Optoelectronic Devices, and Heterogenous Integration - Accelerated life testing in photonics packaging: its objectives, role, attributes, challenges, pitfalls, predictive models, and interaction with other accelerated stress categories
Suhir, Ephraim, Driessen, Alfred, Baets, Roel G., McInerney, John G., Suhir, EphraimVolume:
4947
Year:
2003
Language:
english
DOI:
10.1117/12.476691
File:
PDF, 127 KB
english, 2003