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SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Advanced Sensor Systems and Applications II - Displacement measurement based on moire technique and polarization modulation
Zeng, Aijun, Rao, Yun-Jiang, Kwon, Osuk Y., Wang, Xiangzhao, Li, Dailin, Peng, Gang-Ding, Dong, Zuoren, Huang, Lihua, Zhao, YongkaiVolume:
5634
Year:
2004
Language:
english
DOI:
10.1117/12.572095
File:
PDF, 98 KB
english, 2004