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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Cryogenic Optical Systems and Instruments XI - Automation, operation, and data analysis in the cryogenic, high accuracy, refraction measuring system (CHARMS)
Frey, Bradley J., Heaney, James B., Burriesci, Lawrence G., Leviton, Douglas B.Volume:
5904
Year:
2005
Language:
english
DOI:
10.1117/12.619302
File:
PDF, 1.00 MB
english, 2005