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SPIE Proceedings [SPIE SPIE Optics + Photonics - San Diego, California, USA (Sunday 13 August 2006)] Atmospheric Optical Modeling, Measurement, and Simulation II - Improvements in C n 2 profile monitoring with a Shack Hartmann wavefront sensor
Vedrenne, Nicolas, Hammel, Stephen M., Kohnle, Anton, Michau, Vincent, Robert, Clélia, Conan, Jean-MarcVolume:
6303
Year:
2006
Language:
english
DOI:
10.1117/12.680444
File:
PDF, 311 KB
english, 2006