SPIE Proceedings [SPIE Defense and Security Symposium - Orlando, Florida, USA (Monday 9 April 2007)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII - Designing an error metric for super-resolution enhanced IR passive ranging
Holst, Gerald C., Cha, Jae H., Abbott, A. LynnVolume:
6543
Year:
2007
Language:
english
DOI:
10.1117/12.723411
File:
PDF, 366 KB
english, 2007