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SPIE Proceedings [SPIE International Commission for Optics (ICO 22) - Puebla, Mexico (Monday 15 August 2011)] 22nd Congress of the International Commission for Optics: Light for the Development of the World - Measurement of absolute optical thickness by wavelength tuning interferometer
Hibino, Kenichi, Rodríguez-Vera, Ramón, Díaz-Uribe, Rufino, Kim, Yangjin, Bitou, Youichi, Mitsuishi, MamoruVolume:
8011
Year:
2011
Language:
english
DOI:
10.1117/12.901637
File:
PDF, 822 KB
english, 2011