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Transient tunneling spectroscopy (TTS) study of electron tunneling from phosphorus atoms in silicon
A. Dargys, S. Zurauskas, N. ŽurauskienėVolume:
52
Language:
english
Pages:
6
DOI:
10.1007/bf00323679
Date:
January, 1991
File:
PDF, 596 KB
english, 1991