Direct ion beam deposition of polymeric styrene films and...

Applied Physics A: Materials Science & Processing 1990 / 12 Vol. 51; Iss. 6

Direct ion beam deposition of polymeric styrene films and in situ characterization by electron spectroscopy

D. Ugolini, M. -H. Tuilier, J. Eitle, S. Schelz, J. Q. Wang, P. Oelhafen
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Volume:
51
Language:
english
Pages:
11
DOI:
10.1007/bf00324737
Date:
December, 1990
File:
PDF, 1.30 MB
english, 1990
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