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Dimensional metrology for process and part quality control in micro manufacturing
Hansen, Hans Norgaard, Tosello, Guido, Gasparin, Stefania, Chiffre, Leonardo DeVolume:
2
Year:
2011
Language:
english
Journal:
International Journal of Precision Technology
DOI:
10.1504/ijptech.2011.039455
File:
PDF, 751 KB
english, 2011