Influence of feature form deviations on CMM measurement...

International Journal of Precision Technology 2011 Vol. 2; Iss. 2/3

Influence of feature form deviations on CMM measurement uncertainties

Gestel, Nick Van, Bleys, Philip, Welkenhuyzen, Frank, Kruth, Jean Pierre
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Volume:
2
Year:
2011
Language:
english
Journal:
International Journal of Precision Technology
DOI:
10.1504/ijptech.2011.039459
File:
PDF, 425 KB
english, 2011
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