Inference about Defects in the Presence of Masking

Technometrics 1996 / 08 Vol. 38; Iss. 3

Inference about Defects in the Presence of Masking

Betty J. Flehinger, Benjamin Reiser and Emmanuel Yashchin
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Volume:
38
Language:
english
Journal:
Technometrics
DOI:
10.2307/1270608
Date:
August, 1996
File:
PDF, 1.18 MB
english, 1996
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