SPIE Proceedings [SPIE Optics for Productivity in Manufacturing - Frankfurt, Federal Republic of Germany (Sunday 19 June 1994)] Optical Measurements and Sensors for the Process Industries - Software tool for developing algorithms for surface inspection systems
Harkonen, Ari K., Mitikka, Risto S., Moring, Ilkka, Gorecki, Christophe, Preater, Richard W. T.Volume:
2248
Year:
1994
Language:
english
DOI:
10.1117/12.194352
File:
PDF, 806 KB
english, 1994