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SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors - Principal and error analysis of mirror symmetry method in three-flat test
Czarske, Jurgen, Zhang, Shulian, Sampson, David, Wang, Wei, Liao, Yanbiao, Liu, Yong, Liu, Xu, Jiang, Hongzhen, He, Yuhang, Ren, Huan, Yang, Yi, Zhang, Lin, Shi, Zhendong, Yuan, QuanVolume:
9297
Year:
2014
Language:
english
DOI:
10.1117/12.2071921
File:
PDF, 464 KB
english, 2014