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SPIE Proceedings [SPIE International Conference on Correlation Optics - Chernivtsy, Ukraine (Monday 19 May 1997)] International Conference on Correlation Optics - Fast-acting interference devices for surface roughness diagnostics
Angelsky, Oleg V., Buchkovsky, Ivan A., Maksimyak, Peter P., Neduzhko, Micail A., Angelsky, Oleg V.Volume:
3317
Year:
1997
Language:
english
DOI:
10.1117/12.295694
File:
PDF, 736 KB
english, 1997