SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Polarization: Measurement, Analysis, and Remote Sensing II - Comparison of visible and infrared backscattering Mueller matrices from roughened aluminum surfaces
Lewis, Gareth D., Jordan, David L., Niven, Scott D., Goldstein, Dennis H., Chenault, David B.Volume:
3754
Year:
1999
Language:
english
DOI:
10.1117/12.366336
File:
PDF, 352 KB
english, 1999