SPIE Proceedings [SPIE Photomask and Next Generation...

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SPIE Proceedings [SPIE Photomask and Next Generation Lithography Mask Technology XI - Yokohama, Japan (Wednesday 14 April 2004)] Photomask and Next-Generation Lithography Mask Technology XI - Improvement of develop loading effect in the FEP-171 process

Ha, Tae-Joong, Tanabe, Hiroyoshi, Lee, Young-Mo, Choi, Bo K., Choi, Yongkyoo, Han, Oscar
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Volume:
5446
Year:
2004
Language:
english
DOI:
10.1117/12.557709
File:
PDF, 506 KB
english, 2004
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