SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Image Quality and System Performance II - An investigation of perceived sharpness and sharpness metrics
Zhang, Buyue, Rasmussen, Rene, Miyake, Yoichi, Allebach, Jan P., Pizlo, ZygmuntVolume:
5668
Year:
2005
Language:
english
DOI:
10.1117/12.584627
File:
PDF, 458 KB
english, 2005