SPIE Proceedings [SPIE Optomechatronic Technologies 2005 -...

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SPIE Proceedings [SPIE Optomechatronic Technologies 2005 - Sapporo, Japan (Monday 5 December 2005)] Optomechatronic Machine Vision - A fast tag searching method based on orientation code entropy and density

Takauji, Hidenori, Sumi, Kazuhiko, Kaneko, Shun'ichi, Tanaka, Takayuki
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Volume:
6051
Year:
2005
Language:
english
DOI:
10.1117/12.645755
File:
PDF, 1.02 MB
english, 2005
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