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SPIE Proceedings [SPIE Fifth Symposium - Santiago De Queretaro, Mexico (Thursday 8 September 2005)] Fifth Symposium Optics in Industry - Design and optimization of electronic speckle pattern interferometers to evaluate three-dimensional displacements
Rosas, Eric, Martínez, Amalia, Rayas, Juan A., Cardoso, Rocío, Bermudez, Juan C., Cordero, Raúl, Barbosa-García, OracioVolume:
6046
Year:
2005
Language:
english
DOI:
10.1117/12.674670
File:
PDF, 713 KB
english, 2005