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SPIE Proceedings [SPIE Electronic Imaging 2008 - San Jose, CA (Sunday 27 January 2008)] Image Processing: Algorithms and Systems VI - Evaluation of the independent component analysis algorithm for face recognition under varying conditions
Shirvaikar, Mukul, Astola, Jaakko T., Egiazarian, Karen O., Addepalli, Suresh, Dougherty, Edward R.Volume:
6812
Year:
2008
Language:
english
DOI:
10.1117/12.765923
File:
PDF, 309 KB
english, 2008