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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications - Spectral calibration method for all-reflected Fourier transform imaging spectrometer
Cui, Deqi, Ye, Shenghua, Zhang, Guangjun, Liao, Ningfang, Ma, Ling, Ni, Jun, Liang, Minyong, Lin, YuVolume:
7160
Year:
2008
Language:
english
DOI:
10.1117/12.806914
File:
PDF, 432 KB
english, 2008