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SPIE Proceedings [SPIE Ninth International Symposium on Laser Metrology - Unknown, Singapore (Monday 30 June 2008)] Ninth International Symposium on Laser Metrology - Robust isoclinic calculation for automatic analysis of photoelastic fringe patterns
Quiroga, J. A., Quan, Chenggen, Asundi, Anand, Pascual, E., Villa-Hernandez, J.Volume:
7155
Year:
2008
Language:
english
DOI:
10.1117/12.814610
File:
PDF, 1.22 MB
english, 2008