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SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Practical Holography XXIV: Materials and Applications - Application of holographic interferometry to misalignment measurements in packaging applications
Nikulin, Vladimir V., Bjelkhagen, Hans I., Kostuk, Raymond K., Liu, Zhao, Khandekar, Rahul, Yermekbayeva, Janar, Amirov, AzamatVolume:
7619
Year:
2010
Language:
english
DOI:
10.1117/12.841301
File:
PDF, 1002 KB
english, 2010