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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Advances in X-Ray/EUV Optics and Components V - Beam coherence and x-ray windows
Khounsary, Ali, Khounsary, Ali M., Morawe, Christian, Lai, Barry, Qian, Jun, Goto, Shunji, Khachatryan, Ruben, Maj, Jozef, Huang, XianrongVolume:
7802
Year:
2010
Language:
english
DOI:
10.1117/12.877449
File:
PDF, 12.66 MB
english, 2010