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SPIE Proceedings [SPIE Fourth International Seminar on Modern Cutting and Measuring Engineering - Beijing, China (Friday 10 December 2010)] Fourth International Seminar on Modern Cutting and Measurement Engineering - Multiview photogrammetry data registration by the way of stereovision movement tracking
Sun, Peng, Xin, Jiezhi, Zhu, Lianqing, Lu, Naiguang, Wang, Boen, Wang, Zhongyu, Lin, YiminVolume:
7997
Year:
2010
Language:
english
DOI:
10.1117/12.888452
File:
PDF, 1.25 MB
english, 2010