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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Advances in X-Ray/EUV Optics and Components VI - Johansson crystals for x-ray diffractometry and demanding spectroscopy applications
Verman, Boris, Morawe, Christian, Khounsary, Ali M., Ehlers, Bodo, Kim, Bonglea, Goto, Shunji, Wilcox, Doug, Jiang, LicaiVolume:
8139
Year:
2011
Language:
english
DOI:
10.1117/12.893739
File:
PDF, 21.12 MB
english, 2011