SPIE Proceedings [SPIE 30th Annual Technical Symposium -...

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SPIE Proceedings [SPIE 30th Annual Technical Symposium - San Diego (Friday 1 August 1986)] X-Ray Calibration: Techniques, Sources, and Detectors - VUV-Soft X-Ray Beamline For Spectroscopy And Calibration

Bartlett, R. J., Trela, W. J., Michaud, F. D., Southworth, S. H., Rothe, R., Alkire, R. W., Lee, Ping, Rockett, Paul D.
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Volume:
689
Year:
1986
Language:
english
DOI:
10.1117/12.936582
File:
PDF, 272 KB
english, 1986
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