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Stress measurement in East Asian lacquer thin films owing to changes in relative humidity using phase-shifting interferometry
A. E. Elmahdy, P. D. Ruiz, R. D. Wildman, J. M. Huntley and S. RiversVolume:
467
Language:
english
Journal:
Proceedings: Mathematical, Physical and Engineering Sciences
DOI:
10.2307/29792793
Date:
May, 2011
File:
PDF, 1.67 MB
english, 2011