SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Soft X-Ray Microscopy - New results from MAXIMUM: an x-ray scanning photoemission microscope
Ng, W., Ray-Chaudhuri, Avijit K., Liang, S. H., Welnak, John T., Wallace, John P., Singh, S., Capasso, Cristiano, Cerrina, Franco, Margaritondo, Giorgio, Underwood, James H., Kortright, Jeffrey B., PeVolume:
1741
Year:
1993
Language:
english
DOI:
10.1117/12.138744
File:
PDF, 748 KB
english, 1993