SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Three-Dimensional Image Processing (3DIP) and Applications 2013 - Time-of-flight depth image enhancement using variable integration time
Kim, Sun Kwon, Choi, Ouk, Kang, Byongmin, Kim, James Dokyoon, Kim, Chang-Yeong, Baskurt, Atilla M., Sitnik, RobertVolume:
8650
Year:
2013
Language:
english
DOI:
10.1117/12.2005429
File:
PDF, 1.30 MB
english, 2013