SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Machine Vision Applications in Industrial Inspection III - Binary texture estimation using linear samples
Handley, John C., Dougherty, Edward R., Wu, Frederick Y., Wilson, Stephen S.Volume:
2423
Year:
1995
Language:
english
DOI:
10.1117/12.205512
File:
PDF, 215 KB
english, 1995